This part of IEC TS 62607 establishes a standardized method to determine the key controlcharacteristic
– defect density (%, nm2)

of single layer graphene films by
– electron energy loss spectroscopy (EELS in transmission electron microscopy (TEM)).

This document outlines a method for quantitative measurement of defects in graphene at thenanoscale.

Product Details

Published:

10/31/2025

ISBN(s):

9780539342703

Number of Pages:

38

File Size:

1 file , 3 Bytes

Product Code(s):

30504715, 30504715, 30504715

Note:

This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus